IECStandard Articulated Test Probe is a precision test probe made according to Figure 2 (Fig. 2) of the IEC61032 (Test probe B) and is used to simulate a human finger. It is also used by the standards of CSA, IRAM, UL. IEC60335, IRAM 4220-1 and in most of the rules involved in the verification of accessibility to live parts.
The Jointed Test Finger was made on stainless steel and Polyamide handle.
MaterialAço inoxidável.
LidarPoliamida.
Terminar: Cromagem.
De acordo com: IEC61032, IEC60335-1, IEC60529-2001, IRAM 4220-1, SASO/IEC60335-1, SASO IEC60950, IEC60950/EN60950.
Impulso: 10N
Padrão:
IEC 61032 “Proteção de pessoas e equipamentos por invólucros – Sondas para verificação”
IEC 60335-1 “Aparelhos elétricos domésticos e similares – Segurança – Parte 1: Requisitos gerais”
IEC 60529 “Graus de proteção fornecidos por invólucros (Código IP)”
IRAM 4220-1 “Equipamentos Eletromédicos Parte 1: Requisitos gerais de segurança”
IEC 60950-1 “Information technology equipment – Safety – Part 1: General requirements”
IEC 61032 Standard Articulated Test Probe with 10N Thrust
IEC 61032 Standard Articulated Test Probe with 10N Thrust
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